Coherent X-Ray Diffraction

X-ray diffraction is a technique for studying the characteristics of matter such as macromolecules, crystals, powders, polymers, and fibers.

When x-rays pass through matter, they interact with the electrons in the atoms and become scattered. If the atoms are organized in planes (i.e., the matter is crystalline) and the distances between the atoms are of the same magnitude as the wavelength of the x-rays, then constructive and destructive interference occur and a diffraction pattern forms. Depending on the variety of matter being studied, monochromatic x-rays, pink beam (narrow band) x-rays, or white beam (wide band) x-rays can be used.

PI’s Picks:

PI suggests utilizing one of these exceptional cameras for x-ray diffraction studies:

The Princeton Instruments Quad-RO provides a compact detector design with an IEEE-1394a data interface, electronically balanced quadrants that yield an extremely uniform raw image, dual readout speeds, four-port / single-port readout options, and on-board memory to guarantee loss-free images.

Our compact PIXIS-XF, meanwhile, uses proprietary fiberoptic coupling to preserve the highest spatial resolution, provides high sensitivity for very faint diffracting samples, has a flexible design that allows phosphor removal for system optimization, and features a USB 2.0 data interface. Both models are supported under LINUX.

x-ray diffraction 3D image
High resolution 3D image of GaN particle created using coherent x-ray diffraction imaging. Image courtesy of Dr. Kianwei Mia, University of California, Los Angeles.

 

x-ray diffraction experimental setup example

An experimental setup for coherent x-ray diffraction imaging at SPring-8, Japan, currently the most powerful x-ray source in the world. Photo courtesy of Dr. Kianwei Mia, University of California, Los Angeles.

 

Brochures

X-Ray Camera Brochure
Comprehensive information on direct and indirect X-ray detection technologies from Princeton Instruments. Includes related application and technical notes.

PIXIS-XF<br>  间接探测型X射线相机

PIXIS-XF
间接探测型X射线相机

2kx2k像素分辨率,光钎耦合,探测能量从4 keV 到 >50 keV



LightField <br> 科学成像及光谱分析软件

LightField
科学成像及光谱分析软件

普林斯顿仪器的智能控制软件,您从未体验过的全新设计!



PIXIS-XB <br> 直接探测型X射线相机

PIXIS-XB
直接探测型X射线相机

外置保护铍窗,探测范围 3keV至20keV .



 

特色产品 Coherent X-Ray Diffraction

PIXIS-XF<br>  间接探测型X射线相机

PIXIS-XF
间接探测型X射线相机

2kx2k像素分辨率,光钎耦合,探测能量从4 keV 到 >50 keV


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